Téléchargez le livre : Multi-run Memory Tests for Pattern Sensitive Faults

Multi-run Memory Tests for Pattern Sensitive Faults

Éditeur :

Springer

Paru le : 2018-07-06

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.  The author discusses background selection and address reordering algorithms in multi-run transparent march te...
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Description du livre


This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.  The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.
Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;
Presents practical algorithms for design and implementation of efficient multi-run tests;
Demonstrates methods verified by analytical and experimental investigations.

À propos

Auteur
Ireneusz Mrozek
Éditeur
Springer
Collection
n.c
Parution
2018-07-06
Pages
135 pages
EAN papier
9783319912035

Auteur(s) du livre


Defaut-Illustration Ireneusz Mrozek
Ireneusz Mrozek received his M.Sc. and Ph.D. degrees in computer science in 1994 and 2004,respectively. Since 1994 he has been employed at the Faculty of Computer Science of Bialystok Technical University (Poland). His main research interests include the area of diagnostic testing of embedded memories. Particularly, he focuses on transparent tests for RAM as well as the application of these in the BIST or BISR schemes. He has also gained industrial experience working as a Senior Software Engineer at Motorola Solutions.

Caractéristiques détaillées - droits

EAN PDF
9783319912042
Prix
52,74 €
Nombre pages copiables
1
Nombre pages imprimables
13
Taille du fichier
2673 Ko
Ce livre est accessible aux handicaps informations d'accessibilité
EAN EPUB
9783319912042
Prix
52,74 €
Nombre pages copiables
1
Nombre pages imprimables
13
Taille du fichier
4434 Ko
Ce livre est accessible aux handicaps informations d'accessibilité

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