Outlook and Challenges of Nano Devices, Sensors, and MEMS

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Éditeur :

Springer

Paru le : 2017-02-22

This book provides readers with an overview of the design, fabrication, simulation, and reliability of nanoscale semiconductor devices, MEMS, and sensors, as they serve for realizing the next-generation internet of things. The authors focus on how the nanoscale structures interact with the electrica...
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À propos

Auteur

Éditeur

Collection
n.c

Parution
2017-02-22

Pages
521 pages

EAN papier
9783319508221

Auteur(s) du livre


Juin J. Liou received the B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined the Department of Electrical and Computer Engineering at the University of Central Florida (UCF), Orlando, Florida where he is now the Pegasus Distinguished Professor, Lockheed Martin St. Laurent Professor, and UCF-Analog Devices Fellow. His current research interests are Micro/nanoelectronics computer-aided design, RF device modeling and simulation, and electrostatic discharge (ESD) protection design, modeling and simulation. Dr. Liou holds 8 U.S. patents (3 more filed and pending), and has published 9 books, more than 260 journal papers (including 17 invited review articles), and more than 210 papers (including 90 keynote and invited papers) in international and national conference proceedings.

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EAN PDF
9783319508245
Prix
147,69 €
Nombre pages copiables
5
Nombre pages imprimables
52
Taille du fichier
28774 Ko
EAN EPUB
9783319508245
Prix
147,69 €
Nombre pages copiables
5
Nombre pages imprimables
52
Taille du fichier
14807 Ko

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