Ebooks de Changhwan Shin en EPUB

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Variation-Aware Advanced CMOS Devices and SRAM
Changhwan Shin
This book provides a comprehensive overview of contemporary issues in complementary metal-oxide semiconductor (CMOS) device design, describing how to overcome process-induced random variations such as line-edge-roughness, random-dopant-fluctuation, and work-function...

Editeur : Springer
Parution : 2016-06-06
Collection : Springer Series in Advanced Microelectronics
ePub

52,74 €