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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high...

Editeur : Springer
Parution : 2011-04-14

ePub

147,69 €