Télécharger le livre :  Recent Advances in PMOS Negative Bias Temperature Instability
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This book covers advances in Negative Bias Temperature Instability (NBTI) and will prove useful to researchers and professionals in the semiconductor devices areas. NBTI continues to remain as an important reliability issue for CMOS transistors and circuits. Development...

Editeur : Springer
Parution : 2021-11-25

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147,69
Télécharger le livre :  Fundamentals of Bias Temperature Instability in MOS Transistors
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This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology relies on utilizing artefact-free stress and measurement methods...

Editeur : Springer
Parution : 2015-08-05
Collection : Springer Series in Advanced Microelectronics
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94,94