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Télécharger le livre : Machine Vision Inspection Systems, Machine Learning-Based Approaches
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Machine Vision Inspection Systems, Machine Learning-Based Approaches
Muthukumaran Malarvel , Soumya Ranjan Nayak , Surya Narayan Panda , Prasant Kumar Pattnaik
Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes image processing, machine vision and, pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation...

Editeur : Wiley-Scrivener
Parution : 2021-01-14

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201,35 €