Télécharger le livre :  Electrical Atomic Force Microscopy for Nanoelectronics
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The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters...

Editeur : Springer
Parution : 2019-08-01
Collection : NanoScience and Technology
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168,79
Télécharger le livre :  Metrology and Physical Mechanisms in New Generation Ionic Devices
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This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and...

Editeur : Springer
Parution : 2016-06-18
Collection : Springer Theses
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94,94