Télécharger le livre :  Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
Ajouter à ma liste d'envies
This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error...

Editeur : Springer
Parution : 2021-03-10

PDF

73,84