Télécharger le livre :  Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
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This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error...

Editeur : Springer
Parution : 2021-03-10

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74,19
Télécharger le livre :  Soft Error Reliability Using Virtual Platforms
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This book describes the benefits and drawbacks inherent in the use of virtual platforms (VPs) to perform fast and early soft error assessment of multicore systems. The authors show that VPs provide engineers with appropriate means to investigate new and more efficient...

Editeur : Springer
Parution : 2020-11-02

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95,39
Télécharger le livre :  Electromigration Inside Logic Cells
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This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to...

Editeur : Springer
Parution : 2016-11-26

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52,99
Télécharger le livre :  Circuit Design for Reliability
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This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the...

Editeur : Springer
Parution : 2014-11-08

ePub

95,39
Télécharger le livre :  Poemas de Ricardo Reis
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Ricardo Reis é um dos heterónimos mais conhecidos de Fernando Pessoa. Os seus poemas estão povoados de alusões mitológicas, num estilo neoclássico, influenciado pelo poeta Horácio e pela mitologia grega. Fernando Pessoa iniciou a publicação destas odes nas revistas...

Editeur : Atlântico Press
Parution : 2013-12-01

ePub

9,95
Télécharger le livre :  Protecting Chips Against Hold Time Violations Due to Variability
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With the development of Very-Deep Sub-Micron technologies, process variability is becoming increasingly important and is a very important issue in the design of complex circuits. Process variability is the statistical variation of process parameters, meaning that these...

Editeur : Springer
Parution : 2013-10-01

ePub

95,39
Télécharger le livre :  Radiation Effects on Embedded Systems
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Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at...

Editeur : Springer
Parution : 2007-06-19

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148,39
Télécharger le livre :  Fault-Tolerance Techniques for SRAM-Based FPGAs
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Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous...

Editeur : Springer
Parution : 2007-02-01
Collection : Frontiers in Electronic Testing
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95,39